IEC_62529-2012_IEEE_Std_1641.pdf

IEC 62529 Edition 2.0 2012-06 INTERNATIONAL STANDARD Standard for Signal and Test Definition IEC 62529:2012(E)IEEE Std 1641-2010 IEEE Std 1641 colourinsideCopyrighted material licensed to BR Demo by Thomson Reuters(Scientific),Inc.,,downloaded on Nov-28-2014 by James Madison.No further reproduction or distribution is permitted.Uncontrolled when printed.THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2010 IEEE All rights reserved.IEEE is a registered trademark in the U.S.Patent&Trademark Office,owned by the Institute of Electrical and Electronics Engineers,Inc.Unless otherwise specified,no part of this publication may be reproduced or utilized in any form or by any means,electronic or mechanical,including photocopying and microfilm,without permission in writing from the IEC Central Office.Any questions about IEEE copyright should be addressed to the IEEE.Enquiries about obtaining additional rights to this publication and other information requests should be addressed to the IEC or your local IEC member National Committee.IEC Central Office Institute of Electrical and Electronics Engineers,Inc.3,rue de Varemb 3 Park Avenue CH-1211 Geneva 20 New York,NY 10016-5997 Switzerland United States of America Tel.:+41 22 919 02 11 stds.infoieee.org Fax:+41 22 919 03 00 www.ieee.org infoiec.ch www.iec.ch About the IEC The International Electrotechnical Commission(IEC)is the leading global organization that prepares and publishes International Standards for all electrical,electronic and related technologies.About IEC publications The technical content of IEC publications is kept under constant review by the IEC.Please make sure that you have the latest edition,a corrigenda or an amendment might have been published.Useful links:IEC publications search-www.iec.ch/searchpub The advanced search enables you to find IEC publications by a variety of criteria(reference number,text,technical committee,).It also gives information on projects,replaced and withdrawn publications.IEC Just Published-webstore.iec.ch/justpublished Stay up to date on all new IEC publications.Just Published details all new publications released.Available on-line and also once a month by email.Electropedia-www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 30 000 terms and definitions in English and French,with equivalent terms in additional languages.Also known as the International Electrotechnical Vocabulary(IEV)on-line.Customer Service Centre-webstore.iec.ch/csc If you wish to give us your feedback on this publication or need further assistance,please contact the Customer Service Centre:csciec.ch.Copyrighted material licensed to BR Demo by Thomson Reuters(Scientific),Inc.,,downloaded on Nov-28-2014 by James Madison.No further reproduction or distribution is permitted.Uncontrolled when printed.IEC 62529Edition 2.0 2012-06INTERNATIONAL STANDARD Standard for Signal and Test Definition INTERNATIONAL ELECTROTECHNICAL COMMISSION XMICS 25.040;35.060 PRICE CODEISBN 978-2-83220-103-9 Warning!Make sure that you obtained this publication from an authorized distributor.IEEE Std 1641 colourinsideCopyrighted material licensed to BR Demo by Thomson Reuters(Scientific),Inc.,,downloaded on Nov-28-2014 by James Madison.No further reproduction or distribution is permitted.Uncontrolled when printed.IEC 62529:2012 ii IEEE Std 1641-2010 Published by IEC under license from IEEE.2010 IEEE.All rights reserved.Contents 1.Overview.1 1.1 Scope.1 1.2 Purpose.1 1.3 Application.1 1.4 Annexes.2 2.Definitions,abbreviations,and acronyms.2 2.1 Definitions.2 2.2 Abbreviations and acronyms.4 3.Structure of this standard.5 3.1 Layers.5 3.2 Signal Modeling Language(SML)layer.6 3.3 BSC layer.6 3.4 TSF layer.6 3.5 Test requirement layer.6 3.6 Using the layers.7 4.Signals and SignalFunctions.7 4.1 Introduction.7 4.2 Physical signal states.8 4.3 Event states.9 4.4 Digital stream states.9 5.SML layer.10 6.BSC layer.11 6.1 BSC layer base classes.11 6.2 General description of BSCs.11 6.3 SignalFunction template.12 7.TSF layer.12 7.1 TSF classes.13 7.2 TSF signals defined by a model.13 7.3 TSF signals defined by an external reference.16 8.Test procedure language(TPL).16 8.1 Goals of the TPL.16 8.2 Elements of the TPL.16 8.3 Use of the TPL.17 9.Maximizing test platform independence.17 Annex A(normative)Signal modeling language(SML).18 A.1 Use of the SML.18 A.2 Introduction.18 A.3 Physical types.19 A.4 Signal definitions.22 A.5 Pure signals.24 A.6 Pure signal-combining mechanisms.26 A.7 Pure function transformations.32 Copyrighted material licensed to BR Demo by Thomson Reuters(Scientific),Inc.,,downloaded on Nov-28-2014 by James Madison.No further reproduction or distribution is permitted.Uncontrolled when printed.IEC 62529:2012 IEEE Std 1641-2010 iii Published by IEC under license from IEEE.2010 IEEE.All rights reserved.A.8 Measuring,limiting,and sampling signals.32 A.9 Digital signals.34 A.10 Basic component SML.38 A.11 Fast Fourier