Designation:F769–00StandardTestMethodforMeasuringTransistorandDiodeLeakageCurrents1ThisstandardisissuedunderthefixeddesignationF769;thenumberimmediatelyfollowingthedesignationindicatestheyearoforiginaladoptionor,inthecaseofrevision,theyearoflastrevision.Anumberinparenthesesindicatestheyearoflastreapproval.Asuperscriptepsilon(e)indicatesaneditorialchangesincethelastrevisionorreapproval.1.Scope1.1Thistestmethodcoversthemeasurementofleakagecurrentsoftransistorsanddiodes.Electronicdevicesexposedtoionizingradiationmayshowincreasesinleakagecurrentastheaccumlatedtotaldoserises.1.2Theseproceduresareintendedforthemeasurementofcurrentsintherangefrom10−11to10−3A.1.3Thistestmethodmaybeusedwitheitheravirtual-groundcurrentmeteroraresistance-shuntcurrentmeter.1.4ThevaluesstatedinInternationlSystemofUnits(SI)aretoberegardedasstandard.Nootherunitsofmeasurementareincludedinthistestmethod.1.5Thisstandarddoesnotpurporttoaddressallofthesafetyconcerns,ifany,associatedwithitsuse.Itistheresponsibilityoftheuserofthisstandardtoestablishappro-priatesafetyandhealthpracticesanddeterminetheapplica-bilityofregulatorylimitationspriortouse.2.Terminology2.1Definitions:2.1.1resistance-shuntmeter—ameterthatdeterminescur-rentbymeasuringthevoltagegeneratedacrossshuntresistorsbythecurrent.2.1.2virtual-groundmeter—ameteremployingfeedbacktotheamplifierinsuchawayastomakethemeterinputappeartobeatgroundpotential.3.SummaryofTestMethod3.1Ajunctionwhoseleakageistobedeterminedisreverse-biasedwithapowersupply.Acurrentmeterisplacedinserieswiththejunctionandtheappropriaterangeisselectedonthemeter.Thecurrentisreaddirectlyfromthemeterreadout.4.SignificanceandUse4.1Knowledgeofdiodeandtransistorleakagecurrentsisveryimportanttothecircuitdesigner.Propertransistorbiasingdependsonaccurateleakagecurrentdata.4.2Ionizingradiation,thatis,spaceradiationorgammaradiation,mayhavealongterm(permanent)effectontheleakagecurrent.Thus,thetotaldosetowhichatransistorordiodehasbeenexposedmayhaveasignificanteffectontheleakagecurrenta...
