第46卷第3期2023年6月电子器件ChineseJournalofElectronDevicesVol.46No.3June2023收稿日期:2022-05-24修改日期:2022-06-26DesignandImplementationofReliabilityDataRecoveryDeviceBasedonImpedanceAnalysisLIYuan1,LiBeiguo2,JIAOXinquan1(1.StateKeyLaboratoryofElectronicMeasurementTechnology,NorthUniversityofChina,TaiyuanShanxi030051,China;2.KeyLaboratoryofSpacePhysics,ChinaAcademyofLaunchVehicleTechnology,Beijing100076,China)Abstract:Aimingatthesituationthattheinternalstateofthememoryisunknownandcannotbereadundertheconditionofextremeenvironmentafterthemissile⁃borneflight,adatarecoverydeviceintegratingimpedancetestinganddatareadbackisdesigned.Thede⁃vicecanperformpreciseimpedanceanalysisonthememory,theerroriscontrolledwithin1%,andtheresultsarefedbacktotheuppercomputer.Targetingatthesymbolerrorrate(SER)of0.195%ofon⁃sitedatareadback,causedbytheclockdomaincrossing(CDS)de⁃signoftheethernethardwarecircuit,anEthernetretransmissionprotocolisdesignedtoreliablyreadbacktheinternaldataofthememo⁃rywiththesymbolerrorrateof0%.There...