IEC62417Edition1.02010-04INTERNATIONALSTANDARDNORMEINTERNATIONALESemiconductordevices–Mobileiontestsformetal-oxidesemiconductorfieldeffecttransistors(MOSFETs)Dispositifsàsemiconducteurs–Essaisd’ionsmobilespourtransistorsàsemiconducteuràoxydemétalliqueàeffetdechamp(MOSFETs)IEC62417:2010®LICENSEDTOMECONLIMITED-RANCHI/BANGALORE,FORINTERNALUSEATTHISLOCATIONONLY,SUPPLIEDBYBOOKSUPPLYBUREAU.THISPUBLICATIONISCOPYRIGHTPROTECTEDCopyright©2010IEC,Geneva,SwitzerlandAllrightsreserved.Unlessotherwisespecified,nopartofthispublicationmaybereproducedorutilizedinanyformorbyanymeans,electronicormechanical,includingphotocopyingandmicrofilm,withoutpermissioninwritingfromeitherIECorIEC'smemberNationalCommitteeinthecountryoftherequester.IfyouhaveanyquestionsaboutIECcopyrightorhaveanenquiryaboutobtainingadditionalrightstothispublication,pleasecontacttheaddressbeloworyourlocalIECmemberNationalCommitteeforfurtherinformation.Droitsdereproductionréservés.Saufindicationcontraire,aucunepartiedecettepublicationnepeutêtrereproduiteniutiliséesousquelqueformequecesoitetparaucunprocédé,électroniqueoumécanique,ycomprislaphotocopieetlesmicrofilms,sansl'accordécritdelaCEIouduComiténationaldelaCEIdupaysdudemandeur.SivousavezdesquestionssurlecopyrightdelaCEIousivousdésirezobtenirdesdroitssupplémentairessurcettepublication,utilisezlescoordonnéesci-aprèsoucontactezleComiténationaldelaCEIdevotrepaysderésidence.IECCentralOffice3,ruedeVarembéCH-1211Geneva20SwitzerlandEmail:inmail@iec.chWeb:www.iec.chAbouttheIECTheInternationalElectrotechnicalCommission(IEC)istheleadingglobalorganizationthatpreparesandpublishesInternationalStandardsforallelectrical,electronicandrelatedtechnologies.AboutIECpublicationsThetechnicalcontentofIECpublicationsiskeptunderconstantreviewbytheIEC.Pleasemakesurethatyouhavethelatestedition,acorrigendaoranamendmentmighthavebeenpublished.�CatalogueofIECpublications:www.iec.ch/searchpubTheIECon-lineCatalogueenablesyoutosearchbyavarietyofcriteria(referencenumber,t...
