《电子技术应用》2023年第49卷第4期MicroelectronicTechnology微电子技术基于JTAG的高效调试系统设计与实现张梅娟,辛昆鹏,王丽娟,邓佳伟(中国电子科技集团公司第五十八研究所,江苏无锡214063)摘要:为了给自研处理器芯片提供一种高效方便的调试方法,提出了一种基于JTAG的片内调试系统设计方法。该调试系统在遵循JTAG标准协议的基础上,简化片内调试硬件模式设计,以较少的硬件开销和精简高效的专用调试指令设计,不仅实现了调试中断、指令/数据断点设置、单步执行及寄存器/存储器数据读写等基本调试功能,还支持现场保护与恢复、TraceBuffer、指令插入执行等高级调试功能。经实际芯片测试证明,该调试系统具有兼容JTAG协议、功能全面、灵活高效、结构简单、便于操作等特点。关键词:调试系统;JTAG接口;IEEE1149.1;TAP控制器中图分类号:TN407文献标志码:ADOI:10.16157/j.issn.0258-7998.223168中文引用格式:张梅娟,辛昆鹏,王丽娟,等.基于JTAG的高效调试系统设计与实现[J].电子技术应用,2023,49(4):39-43.英文引用格式:ZhangMeijuan,XinKunpeng,WangLijuan,etal.DesignandimplementationofhighperformancedebuggingsystembasedonJTAG[J].ApplicationofElectronicTechnique,2023,49(4):39-43.DesignandimplementationofhighperformancedebuggingsystembasedonJTAGZhangMeijuan,XinKunpeng,WangLijuan,DengJiawei(TheFifty-EighthResearchInstituteofChinaElectronicTechnologyGroupCorporation,Wuxi214063,China)Abstract:AdebuggingsystembasedonJTAGinterfaceisproposedinthispapertoprovideaneffectiveandconvenientdebug‐gingmethodfordomesticprocessorchip.Thedebuggingsystem,whichisbasedonJTAGstandard,simplifiesthedesignoftheon-chipdebugginghardwaremodule.Withlittlehardwareoverhead,simpleandhighperformancedesignofthedebugginginstruc‐tion,itisusedtorealizethedebugginginterrupt,breakpointandwatchpointsetting,singlesteprunning,registerormemoryreadandwrite,andotherbasedebuggingfunctions,aswellassenceprotectionandrecovery,tracebuffer,instructioninsertexecutionandotheradvanceddebuggingfunctions.Afterpassedtheactualchiptesting,thedebuggingsystemhascompatibilitywithJTAGprotocol,comprehensivefunctions,highperformance,simplestructure,convenientforoperationand...