Designation:E1161−09(Reapproved2014)StandardPracticeforRadiologicExaminationofSemiconductorsandElectronicComponents1ThisstandardisissuedunderthefixeddesignationE1161;thenumberimmediatelyfollowingthedesignationindicatestheyearoforiginaladoptionor,inthecaseofrevision,theyearoflastrevision.Anumberinparenthesesindicatestheyearoflastreapproval.Asuperscriptepsilon(´)indicatesaneditorialchangesincethelastrevisionorreapproval.ThisstandardhasbeenapprovedforusebyagenciesoftheU.S.DepartmentofDefense.1.Scope1.1Thispracticeprovidestheminimumrequirementsfornondestructiveradiologicexaminationofsemiconductordevices,microelectronicdevices,electromagneticdevices,electronicandelectricaldevices,andthematerialsusedforconstructionoftheseitems.1.2Thispracticecoverstheradiologicexaminationoftheseitemstodetectpossibledefectiveconditionswithinthesealedcase,especiallythoseresultingfromsealingthelidtothecase,andinternaldefectssuchasextraneousmaterial(foreignobjects),improperinterconnectingwires,voidsinthedieattachmaterialorintheglass(whensealingglassisused)orphysicaldamage.1.3Thevaluesstatedininch-poundunitsaretoberegardedasstandard.Nootherunitsofmeasurementareincludedinthispractice.1.4Thisstandarddoesnotpurporttoaddressallofthesafetyconcerns,ifany,associatedwithitsuse.Itistheresponsibilityoftheuserofthisstandardtoestablishappro-priatesafetyandhealthpracticesanddeterminetheapplica-bilityofregulatorylimitationspriortouse.2.ReferencedDocuments2.1ASTMStandards:2E94GuideforRadiographicExaminationE431GuidetoInterpretationofRadiographsofSemicon-ductorsandRelatedDevicesE543SpecificationforAgenciesPerformingNondestructiveTestingE801PracticeforControllingQualityofRadiologicalEx-aminationofElectronicDevicesE666PracticeforCalculatingAbsorbedDoseFromGammaorXRadiationE999GuideforControllingtheQualityofIndustrialRadio-graphicFilmProcessingE1000GuideforRadioscopyE1079PracticeforCalibrationofTransmissionDensitom-etersE1254GuideforStorageofRadiographsandUnexposedIndustrialRadiographicFilmsE1255Practicefor...
